Fine-Grained Cycle Sharing (FGCS) systems aim at utilizing the large amount of idle computational resources available on the Internet. Such systems allow guest jobs to run on a ho...
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
Peter Wohl, John A. Waicukauski, Sanjay Patel, Min...
This paper presents a systematic design methodology for yield enhancement of asynchronous logic circuits using 3-D (3-Dimensional) integration technology. In this design, the targ...
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
M. Haykel Ben Jamaa, Yusuf Leblebici, Giovanni De ...
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...