75 search results - page 12 / 15 » Fault tolerant methods for reliability in FPGAs |
HPDC
2007
IEEE
14 years 2 months ago
2007
IEEE
Fine-Grained Cycle Sharing (FGCS) systems aim at utilizing the large amount of idle computational resources available on the Internet. Such systems allow guest jobs to run on a ho...
DAC
2003
ACM
14 years 1 months ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
GLVLSI
2006
IEEE
14 years 2 months ago
2006
IEEE
This paper presents a systematic design methodology for yield enhancement of asynchronous logic circuits using 3-D (3-Dimensional) integration technology. In this design, the targ...
DAC
2009
ACM
14 years 9 months ago
2009
ACM
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
DAC
2008
ACM
14 years 9 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...