72 search results - page 9 / 15 » Fault-Based Test Case Generation for Component Connectors |
DAC
2012
ACM
11 years 10 months ago
2012
ACM
In this work we address the problem of managing interconnect timing in high-level synthesis by generating a layoutfriendly microarchitecture. A metric called spreading score is pr...
KBSE
2007
IEEE
14 years 1 months ago
2007
IEEE
Automating the generation of object-oriented unit tests is a challenging task. This is mainly due to the complexity and peculiarities that the principles of object-orientation imp...
ICSM
2005
IEEE
14 years 1 months ago
2005
IEEE
Test suite reduction is an important test maintenance activity that attempts to reduce the size of a test suite with respect to some criteria. Emerging trends in software developm...
ECAI
2010
Springer
13 years 8 months ago
2010
Springer
Answer-set programming (ASP) is a well-acknowledged paradigm for declarative problem solving, yet comparably little effort has been spent on the investigation of methods to support...
VTS
2003
IEEE
14 years 23 days ago
2003
IEEE
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...