15 search results - page 3 / 3 » Fault-Simulation Based Design Error Diagnosis for Sequential... |
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
— Computing counterexamples is a crucial task for error diagnosis and debugging of sequential systems. If an implementation does not fulfill its specification, counterexamples ...
CF
2004
ACM
14 years 26 days ago
2004
ACM
This paper discusses fault-tolerant techniques for SRAM-based FPGAs. These techniques can be based on circuit level modifications, with obvious modifications in the programmable a...
HPCA
2006
IEEE
14 years 7 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...