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DPHOTO
2009
13 years 5 months ago
2009
The lifetime of solid-state image sensors is limited by the appearance of defects, particularly hot-pixels, which we have previously shown to develop continuously over the sensor ...
ECRTS
2009
IEEE
13 years 5 months ago
2009
IEEE
Blackouts in our daily life can be disastrous with enormous economic loss. Blackouts usually occur when appropriate corrective actions are not effectively taken for an initial con...
ICC
2009
IEEE
13 years 5 months ago
2009
IEEE
Peak to average power ratio (PAPR) and symbol loss rate (SLR) are two challenges of multicarrier based communications that have recently drawn much attention. High SLR renders the ...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
While Dynamic Voltage Scaling (DVS) remains as a popular energy management technique for real-time embedded applications, recent research has identified significant and negative i...