This work describes a novel method for statistical analysis of multi-material components. The application scenario is industrial 3D X-ray computed tomography, emphasizing metrolog...
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
We propose a concept for integrating multiple sensors in real-time robot control. To increase the controller robustness under diverse uncertainties, the robot systematically gener...
Yorck von Collani, Markus Ferch, Jianwei Zhang, Al...
This paper addresses the problem of reconstructing surface models of indoor scenes from sparse 3D scene structure captured from N camera views. Sparse 3D measurements of real scen...
Anastasios Manessis, Adrian Hilton, Philip F. McLa...