: In this paper, we propose an image driven shape deformation approach for stylizing a 3D mesh using styles learned from existing 2D illustrations. Our approach models a 2D illustr...
— As nanometer technology advances, the post-CMP dielectric thickness variation control becomes crucial for manufacturing closure. To improve CMP quality, dummy feature filling ...
— This paper concerns the problem of actively searching for and localizing ground features by a coordinated team of air and ground robotic sensor platforms. The approach taken bu...
Ben Grocholsky, Rahul Swaminathan, James F. Keller...
With continued aggressive process scaling in the subwavelength lithographic regime, resolution enhancement techniques (RETs) such as optical proximity correction (OPC) are an inte...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
Consistent efforts are being made to build Computer-Aided Detection and Diagnosis systems for radiological images. Such systems depend on automated detection of various disease pat...
Mamatha Rudrapatna, Van Mai, Arcot Sowmya, Peter W...