376 search results - page 20 / 76 » Feedback-Directed Random Test Generation |
FPGA
2008
ACM
13 years 9 months ago
2008
ACM
This paper introduces a method of constructing random number generators from four of the basic primitives provided by FPGAs: Flip-Flips, Lookup-Tables, Shift Registers, and RAMs. ...
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
ATS
2000
IEEE
14 years 6 days ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
ALENEX
2001
13 years 9 months ago
2001
The purpose of this paper is to provide a preliminary report on the rst broad-based experimental comparison of modern heuristics for the asymmetric traveling salesmen problem ATSP....