1173 search results - page 35 / 235 » Filtering Test Models to Support Incremental Testing |
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
WOSP
2004
ACM
14 years 1 months ago
2004
ACM
Performance characteristics, such as response time, throughput and scalability, are key quality attributes of distributed applications. Current practice, however, rarely applies s...
DDECS
2007
IEEE
14 years 2 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
JSW
2008
13 years 7 months ago
2008
An application framework provides reusable design and implementation for a family of software systems. At the application engineering stage, application developers extend framework...
SDM
2009
SIAM
14 years 4 months ago
2009
SIAM
A fundamental task of data analysis is comprehending what distinguishes clusters found within the data. We present the problem of mining distinguishing sets which seeks to find s...