A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
Soner Yaldiz, Umut Arslan, Xin Li, Larry T. Pilegg...
Functional decomposition is a process of splitting a complex circuit into smaller sub-circuits. This paper deals with the problem of determining the set of best free and bound var...
We study the circuit complexity of the powering function, defined as POWm(Z) = Zm for an n-bit integer input Z and an integer exponent m poly(n). Let LTd denote the class of func...
In this paper, we prove that the quadratic polynomials modulo 3 with the largest correlation with parity are unique up to permutation of variables and constant factors. As a conseq...
We show that thepermanent cannot be computed by uniform constantdepth threshold circuits of size Tn, for any function T such that for all k, Tk n = o2n. More generally, we show th...