As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
Kypros Constantinides, Stephen Plaza, Jason A. Blo...
This workshop provides a forum for an overview, project presentations, and discussion of the research fostered and funded initially by the NSF Next Generation Software (NGS) Progr...
An Operational Information System (OIS) supports a real-time view of an organization’s information critical to its logistical business operations. A central component of an OIS ...
We present a general scheme for virtualizing main memory errorcorrection mechanisms, which map redundant information needed to correct errors into the memory namespace itself. We ...
With the increasing complexity of large-scale distributed (LSD) systems, an efficient monitoring mechanism has become an essential service for improving the performance and reliab...
Ehab S. Al-Shaer, Hussein M. Abdel-Wahab, Kurt Mal...