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» Framework for Fault Analysis and Test Generation in DRAMs
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ATVA
2007
Springer
136views Hardware» more  ATVA 2007»
14 years 1 months ago
Symbolic Fault Tree Analysis for Reactive Systems
Fault tree analysis is a traditional and well-established technique for analyzing system design and robustness. Its purpose is to identify sets of basic events, called cut sets, wh...
Marco Bozzano, Alessandro Cimatti, Francesco Tappa...
ISSRE
2003
IEEE
14 years 19 days ago
A New Software Testing Approach Based on Domain Analysis of Specifications and Programs
Partition testing is a well-known software testing technique. This paper shows that partition testing strategies are relatively ineffective in detecting faults related to small sh...
Ruilian Zhao, Michael R. Lyu, Yinghua Min
CASES
2007
ACM
13 years 11 months ago
SCCP/x: a compilation profile to support testing and verification of optimized code
Embedded systems are often used in safety-critical environments. Thus, thorough testing of them is mandatory. A quite active research area is the automatic test-case generation fo...
Raimund Kirner
FORTE
1997
13 years 8 months ago
A Framework for Distributed Object-Oriented Testing
Distributed programming and object-oriented programming are two popular programming paradigms. The former is driven by advances in networking technology whereas the latter provide...
Alan C. Y. Wong, Samuel T. Chanson, Shing-Chi Cheu...
DFT
2006
IEEE
148views VLSI» more  DFT 2006»
13 years 9 months ago
Bilateral Testing of Nano-scale Fault-tolerant Circuits
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
Lei Fang, Michael S. Hsiao