202 search results - page 13 / 41 » Framework for Fault Analysis and Test Generation in DRAMs |
SIGSOFT
2006
ACM
14 years 1 months ago
2006
ACM
Unit test cases are focused and efficient. System tests are effective at exercising complex usage patterns. Differential unit tests (DUT) are a hybrid of unit and system tests. T...
TAICPART
2010
IEEE
13 years 5 months ago
2010
IEEE
Abstract. With pairwise testing, the test model is a list of N parameters. Each test case is an N-tuple; the test space is the cross product of the N parameters. A pairwise test is...
DATE
2000
IEEE
13 years 11 months ago
2000
IEEE
The Boolean satisfiability problem (SAT) has various applications in electronic design automation (EDA) fields such as testing, timing analysis and logic verification. SAT has bee...
VTS
2007
IEEE
14 years 1 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
ICECCS
2002
IEEE
14 years 10 days ago
2002
IEEE
The characteristics of object-oriented software affect type and relevance of faults. In particular, the state of the objects may cause faults that cannot be easily revealed with t...