202 search results - page 20 / 41 » Framework for Fault Analysis and Test Generation in DRAMs |
IOLTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
CCGRID
2006
IEEE
14 years 1 months ago
2006
IEEE
Grid computing is becoming the natural way to aggregate and share large sets of heterogeneous resources. With the infrastructure becoming ready for the challenge, current grid dev...
ATS
2000
IEEE
13 years 11 months ago
2000
IEEE
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
DAC
2010
ACM
13 years 10 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
TSE
2010
13 years 5 months ago
2010
This paper presents an innovative model of a program’s internal behavior over a set of test inputs, called the probabilistic program dependence graph (PPDG), that facilitates pr...