202 search results - page 24 / 41 » Framework for Fault Analysis and Test Generation in DRAMs |
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
JSS
2008
13 years 5 months ago
2008
This report presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network traffic in Distributed Real-Time Systems (DRTS). T...
ICSM
1994
IEEE
13 years 11 months ago
1994
IEEE
Although data pow analysis was first developed for use in compilers, its usefulness is now recognized in many software tools. Because of its compiler origins, the computation of d...
PLDI
2000
ACM
13 years 11 months ago
2000
ACM
Dynamic class loading during program execution in the JavaTM Programming Language is an impediment for generating code that is as e cient as code generated using static wholeprogr...
WIAMIS
2009
IEEE
14 years 2 months ago
2009
IEEE
In this work a framework for constructing object detection classifiers using weakly annotated social data is proposed. Social information is combined with computer vision techniq...