202 search results - page 5 / 41 » Framework for Fault Analysis and Test Generation in DRAMs |
ATS
2000
IEEE
13 years 11 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
ISSRE
2000
IEEE
13 years 11 months ago
2000
IEEE
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
ICST
2010
IEEE
13 years 5 months ago
2010
IEEE
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
ISSRE
2003
IEEE
14 years 19 days ago
2003
IEEE
Software testing and software fault tolerance are two major techniques for developing reliable software systems, yet limited empirical data are available in the literature to eval...