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CVPR
2000
IEEE
14 years 9 months ago
A General Method for Errors-in-Variables Problems in Computer Vision
The Errors-in-Variables (EIV) model from statistics is often employed in computer vision thoughonlyrarely under this name. In an EIV model all the measurements are corrupted by no...
Bogdan Matei, Peter Meer
IBPRIA
2007
Springer
14 years 1 months ago
Optimally Discriminant Moments for Speckle Detection in Real B-Scan Images
Detection of speckle in ultrasound (US) images has been regarded as an important research topic in US imaging, mainly focusing on two specific applications: improving signal to no...
Robert Marti, Joan Martí, Jordi Freixenet, ...
CVIU
2006
166views more  CVIU 2006»
13 years 7 months ago
Non-parametric and light-field deformable models
Statistical shape-and-texture appearance models use image morphing to define a rich, compact representation of object appearance. They are useful in a variety of applications incl...
Chris Mario Christoudias, Louis-Philippe Morency, ...
TMI
2011
147views more  TMI 2011»
13 years 2 months ago
Labeling of Lumbar Discs Using Both Pixel- and Object-Level Features With a Two-Level Probabilistic Model
Abstract—Backbone anatomical structure detection and labeling is a necessary step for various analysis tasks of the vertebral column. Appearance, shape and geometry measurements ...
Raja' S. Alomari, Jason J. Corso, Vipin Chaudhary
DAC
2006
ACM
14 years 8 months ago
Statistical logic cell delay analysis using a current-based model
A statistical model for the purpose of logic cell timing analysis in the presence of process variations is presented. A new current-based cell delay model is utilized, which can a...
Hanif Fatemi, Shahin Nazarian, Massoud Pedram