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ICSE
2003
IEEE-ACM
14 years 9 months ago
Constructing Test Suites for Interaction Testing
Software system faults are often caused by unexpected interactions among components. Yet the size of a test suite required to test all possible combinations of interactions can be...
Myra B. Cohen, Peter B. Gibbons, Warwick B. Mugrid...
MTV
2007
IEEE
118views Hardware» more  MTV 2007»
14 years 3 months ago
Reduction of Power Dissipation during Scan Testing by Test Vector Ordering
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
Wang-Dauh Tseng, Lung-Jen Lee
ASE
2004
148views more  ASE 2004»
13 years 9 months ago
TestEra: Specification-Based Testing of Java Programs Using SAT
TestEra is a framework for automated specification-based testing of Java programs. TestEra requires as input a Java method (in sourcecode or bytecode), a formal specification of th...
Sarfraz Khurshid, Darko Marinov
ATS
2010
IEEE
261views Hardware» more  ATS 2010»
13 years 7 months ago
The Test Ability of an Adaptive Pulse Wave for ADC Testing
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
Xiaoqin Sheng, Hans G. Kerkhoff
EUROMICRO
2003
IEEE
14 years 2 months ago
Merging components and testing tools: The Self-Testing COTS Components (STECC) Strategy
Development of a software system from existing components can surely have various benefits, but can also entail a series of problems. One type of problems is caused by a limited ...
Sami Beydeda, Volker Gruhn