192 search results - page 23 / 39 » Functional Scan Chain Testing |
VTS
2003
IEEE
14 years 2 months ago
2003
IEEE
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
DFT
2005
IEEE
13 years 11 months ago
2005
IEEE
Linear decompressors are the dominant methodology used in commercial test data compression tools. However, they are generally not able to exploit correlations in the test data, an...
ET
2002
13 years 9 months ago
2002
As we approach 100nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-onchips. Voltage distortion (noise) and delay viol...
ICES
2010
Springer
13 years 7 months ago
2010
Springer
Abstract. In this paper it is demonstrated how two issues from the area of testing electronic components can be merged and solved by means of a genetic algorithm. The two issues ar...
NOCS
2007
IEEE
14 years 3 months ago
2007
IEEE
Abstract— The behaviour of systems on chip (SOC) is complex because they contain multiple processors that interact through concurrent interconnects, such as networks on chip (NOC...