Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McC...
Linear decompressors are the dominant methodology used in commercial test data compression tools. However, they are generally not able to exploit correlations in the test data, an...
As we approach 100nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-onchips. Voltage distortion (noise) and delay viol...
Abstract. In this paper it is demonstrated how two issues from the area of testing electronic components can be merged and solved by means of a genetic algorithm. The two issues ar...
Abstract— The behaviour of systems on chip (SOC) is complex because they contain multiple processors that interact through concurrent interconnects, such as networks on chip (NOC...
Kees Goossens, Bart Vermeulen, Remco van Steeden, ...