192 search results - page 25 / 39 » Functional Scan Chain Testing |
MTDT
2003
IEEE
14 years 2 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
TIP
2010
13 years 3 months ago
2010
Lidar waveforms are 1D signals representing a train of echoes caused by reflections at different targets. Modeling these echoes with the appropriate parametric function is useful ...
DAC
2003
ACM
14 years 10 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
ISQED
2002
IEEE
14 years 2 months ago
2002
IEEE
This paper presents a methodology for the statistical analysis of clock tree structures. It allows to accurately predict and analyze the impact of process variation on clock skew....
IJAIT
2010
13 years 7 months ago
2010
Many real world industrial applications involve finding a Hamiltonian path with minimum cost. Some instances that belong to this category are transportation routing problem, scan c...