123 search results - page 15 / 25 » Functional Test Generation for FSMs by Fault Extraction |
DAC
2002
ACM
14 years 8 months ago
2002
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...
GLVLSI
2002
IEEE
14 years 13 days ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
ISSRE
2003
IEEE
14 years 23 days ago
2003
IEEE
Partition testing is a well-known software testing technique. This paper shows that partition testing strategies are relatively ineffective in detecting faults related to small sh...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
MEMOCODE
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...