123 search results - page 16 / 25 » Functional Test Generation for FSMs by Fault Extraction |
ATS
2010
IEEE
13 years 5 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
ITC
1996
IEEE
13 years 11 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
ICST
2010
IEEE
13 years 6 months ago
2010
IEEE
—When a program is modified during software evolution, developers typically run the new version of the program against its existing test suite to validate that the changes made ...
ICSE
2003
IEEE-ACM
14 years 7 months ago
2003
IEEE-ACM
Web applications have become critical components of the global information infrastructure, and it is important that they be validated to ensure their reliability. Therefore, many ...
DAC
2006
ACM
13 years 9 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...