123 search results - page 17 / 25 » Functional Test Generation for FSMs by Fault Extraction |
IEEEARES
2006
IEEE
14 years 1 months ago
2006
IEEE
There is an increasing demand for highly reliable systems in the safety conscious climate of today’s world. When a fault does occur there are two desirable outcomes. Firstly, de...
SRDS
1993
IEEE
13 years 11 months ago
1993
IEEE
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...
SIGMOD
2006
ACM
14 years 7 months ago
2006
ACM
Testing of database applications is crucial for ensuring high software quality as undetected faults can result in unrecoverable data corruption. The problem of database applicatio...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...