123 search results - page 19 / 25 » Functional Test Generation for FSMs by Fault Extraction |
ICCS
2005
Springer
14 years 1 months ago
2005
Springer
Abstract. As High Performance Computing becomes more collaborative, software certification practices are needed to quantify the credibility of shared applications. To demonstrate q...
TCAD
2002
13 years 7 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
TNN
2010
13 years 2 months ago
2010
The weight-decay technique is an effective approach to handle overfitting and weight fault. For fault-free networks, without an appropriate value of decay parameter, the trained ne...
ICCAD
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...