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    DAC
    2003
    ACM
    129views Computer Architecture» more  DAC 2003»
    A scalable software-based self-test methodology for programmable processors
    14 years 8 months ago
    A scalable software-based self-test methodology for programmable processors
    Download  esdat.ucsd.edu
    Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
    Li Chen, Srivaths Ravi, Anand Raghunathan, Sujit D...
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    IICAI
    2007
    325views Artificial Intelligence» more  IICAI 2007»
    Automated Test Generation from Models Based on Functional Software Specifications
    13 years 9 months ago
    Automated Test Generation from Models Based on Functional Software Specifications
    Download  mqm.in.tum.de
    The paper presents first results of a project that aims at building a model-based tool for functional testing of control software for passenger vehicles. The objective is that this...
    Michael Esser, Peter Struss
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    SERP
    2007
    182views Software Engineering» more  SERP 2007»
    From Functional Requirements through Test Evaluation Design to Automatic Test Data Patterns Retrieval - a Concept for Testing of
    13 years 9 months ago
    From Functional Requirements through Test Evaluation Design to Automatic Test Data Patterns Retrieval - a Concept for Testing of
    Download  web.fokus.fraunhofer.de
    - Functional testing of software dedicated for hybrid embedded systems should start at the early development phase and requires analysis of discrete and continuous signals, where t...
    Justyna Zander-Nowicka, Abel Marrero Pérez,...
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    ATS
    2009
    IEEE
    127views Hardware» more  ATS 2009»
    On the Generation of Functional Test Programs for the Cache Replacement Logic
    14 years 18 days ago
    On the Generation of Functional Test Programs for the Cache Replacement Logic
    Download  www.cad.polito.it
    Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
    Wilson J. Perez, Danilo Ravotto, Edgar E. Sá...
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    MTV
    2005
    IEEE
    138views Hardware» more  MTV 2005»
    Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
    14 years 1 months ago
    Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
    Download  www.cad.polito.it
    Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
    Paolo Bernardi, Ernesto Sánchez, Massimilia...
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