572 search results - page 35 / 115 » Functional Test Generation using Constraint Logic Programmin... |
IFM
2005
Springer
14 years 2 months ago
2005
Springer
We provide an automatic method for calculating the path condition for programs with real time constraints. This method can be used for the semiautomatic verification of a unit of ...
ETS
2006
IEEE
14 years 2 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
CAV
2011
Springer
13 years 14 days ago
2011
Springer
Abstract. Many automatic testing, analysis, and verification techniques for programs can effectively be reduced to a constraint-generation phase followed by a constraint-solving ...
AUTOMATICA
2008
13 years 9 months ago
2008
The problem of computing bounds on the region-of-attraction for systems with polynomial vector fields is considered. Invariant subsets of the region-of-attraction are characterize...
ET
2010
13 years 7 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...