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ASPLOS
2006
ACM
14 years 1 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
VTS
1997
IEEE
13 years 11 months ago
1997
IEEE
Despite all of the advantages that circular BIST ofsers compared to conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion, it has se...
GI
2007
Springer
14 years 1 months ago
2007
Springer
: A strategy for automatic test case selection based on the use of a similarity function is presented. Test case selection is a crucial activity to model-based testing since the nu...
ISVLSI
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...