82 search results - page 12 / 17 » Functional Testing of Microprocessors with Graded Fault Cove... |
STVR
2010
13 years 2 months ago
2010
As we move to developing object-oriented programs, the complexity traditionally found in functions and procedures is moving to the connections among components. Different faults o...
JCP
2006
13 years 7 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
TVLSI
2002
13 years 7 months ago
2002
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...