138 search results - page 4 / 28 » Functional test generation for delay faults in combinational... |
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
ET
2002
13 years 7 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
ATS
2003
IEEE
14 years 29 days ago
2003
IEEE
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...