∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, H...
In today’s embedded applications a significant portion of energy is spent in the memory subsystem. Several approaches have been proposed to minimize this energy, including the u...
The relatively poor scaling of interconnect in modern digital circuits necessitates a number of design optimizations, which must typically be iterated several times to meet the spe...
In the last decades enormous advances have been made possible for modelling complex (physical) systems by mathematical equations and computer algorithms. To deal with very long run...
Many distributed real-time systems face the challenge of dynamically maximizing system utility and meeting stringent resource constraints in response to fluctuations in system wo...