— Conventional methods for optimal sizing of wires and transistors use linear resistor-capacitor (RC) circuit models and the Elmore delay as a measure of signal delay. If the RC ...
Lieven Vandenberghe, Stephen P. Boyd, Abbas A. El ...
Abstract— Double patterning lithography (DPL) is in current production for memory products, and is widely viewed as inevitable for logic products at the 32nm node. DPL decomposes...
Abstract. We show that optimal alphabetic binary trees can be constructed in O(n) time if the elements of the initial sequence are drawn from a domain that can be sorted in linear ...
T. C. Hu, Lawrence L. Larmore, J. David Morgenthal...
In message passing environments, the message send time is dominated by overheads that are relatively independent of the message size. Therefore, fine-grained applications (such a...
Malolan Chetlur, Nael B. Abu-Ghazaleh, Radharamana...
Abstract. A framework is introduced for the identification of controls for single-class timevarying queueing networks that are asymptotically optimal in the so-called uniform acce...