: In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we pr...
Mario Friske, Bernd-Holger Schlingloff, Stephan We...
Ever-increasing complexity of large-scale applications and continuous increases in sizes of the data they process make the problem of maximizing performance of such applications a...
Mahmut T. Kandemir, Seung Woo Son, Mustafa Karak&o...
Over the past year we have been exploring the use of FPGA-based custom computing machines for several sonar beamforming applications, including time-domain beamforming[1], frequen...
Background: The data from DNA microarrays are increasingly being used in order to understand effects of different conditions, exposures or diseases on the modulation of the expres...
Reuben Thomas, Luis de la Torre, Xiaoqing Chang, S...
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...