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» Further results on large sets of Kirkman triple systems
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MBEES
2008
13 years 8 months ago
Composition of Model-based Test Coverage Criteria
: In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we pr...
Mario Friske, Bernd-Holger Schlingloff, Stephan We...
FAST
2008
13 years 9 months ago
Improving I/O Performance of Applications through Compiler-Directed Code Restructuring
Ever-increasing complexity of large-scale applications and continuous increases in sizes of the data they process make the problem of maximizing performance of such applications a...
Mahmut T. Kandemir, Seung Woo Son, Mustafa Karak&o...
FCCM
1998
IEEE
107views VLSI» more  FCCM 1998»
13 years 11 months ago
Frequency-Domain Sonar Processing in FPGAs and DSPs
Over the past year we have been exploring the use of FPGA-based custom computing machines for several sonar beamforming applications, including time-domain beamforming[1], frequen...
Paul Graham, Brent E. Nelson
BMCBI
2010
76views more  BMCBI 2010»
13 years 7 months ago
Validation and characterization of DNA microarray gene expression data distribution and associated moments
Background: The data from DNA microarrays are increasingly being used in order to understand effects of different conditions, exposures or diseases on the modulation of the expres...
Reuben Thomas, Luis de la Torre, Xiaoqing Chang, S...
DATE
2007
IEEE
86views Hardware» more  DATE 2007»
14 years 1 months ago
Reduction of detected acceptable faults for yield improvement via error-tolerance
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer