1124 search results - page 135 / 225 » Future Challenges |
162
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ICCD
2003
IEEE
16 years 1 months ago
2003
IEEE
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
105
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ICCD
2000
IEEE
16 years 1 months ago
2000
IEEE
In superscalar architectures, out-of-order issue mechanisms increase performance by dynamically rescheduling instructions that cannot be statically reordered by the compiler. Whil...
138
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ICCAD
2006
IEEE
16 years 1 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
133
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HICSS
2010
IEEE
15 years 11 months ago
2010
IEEE
Defining requirements without satisfying success critical stakeholders often leads to expensive project failures. Enabling interdisciplinary stakeholders to rapidly and effectivel...
121
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CHI
2010
ACM
15 years 11 months ago
2010
ACM
We present an empirical investigation of video-mediated free play between 13 pairs of friends (ages 7 and 8). The pairs spent 10 minutes playing with each of four different protot...