171 search results - page 9 / 35 » Future Performance Challenges in Nanometer Design |
DAC
2007
ACM
14 years 8 months ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
ISCA
2010
IEEE
14 years 15 days ago
2010
IEEE
Aggressive technology scaling into the nanometer regime has led to a host of reliability challenges in the last several years. Unlike onchip caches, which can be efficiently prot...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
As technology advances into the nanometer territory, the interconnect delay has become a first-order effect on chip performance. To handle this effect, the X-architecture has been...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
HPCA
2009
IEEE
14 years 2 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...