268 search results - page 7 / 54 » Gating currents |
VLSID
2007
IEEE
14 years 7 months ago
2007
IEEE
In this paper we explore the use of a set of novel design metrics for characterizing the impact of gate oxide tunneling current in nanometer CMOS devices and perform Monte Carlo s...
ERSA
2006
13 years 8 months ago
2006
Abstract-- We have continued development of Optically Reconfigurable Gate Arrays (ORGAs) to realize larger virtual gate count VLSIs than currently available VLSIs. The grain and st...
TVLSI
2010
13 years 2 months ago
2010
Abstract--An asynchronous high-speed wave-pipelined bit-serial link for on-chip communication is presented as an alternative to standard bit-parallel links. The link employs the di...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Gate oxide tunneling current (Igate) is emerging as a key roadblock for device scaling in nanometer-scale CMOS circuits. A practical means to reduce Igate is to leverage dual Tox ...
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
As a result of aggressive technology scaling, gate leakage (gate oxide direct tunneling) has become a major component of total power dissipation. Use of dielectrics of higher perm...