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ICTAC
2004
Springer
14 years 3 months ago
Combining Algebraic and Model-Based Test Case Generation
Abstract. The classical work on test case generation and formal methods focuses either on algebraic or model-based specifications. In this paper we propose an approach to derive t...
Li Dan, Bernhard K. Aichernig
MFCS
2004
Springer
14 years 3 months ago
Generation Problems
Given a fixed computable binary operation , we study the complexity of the following generation problem: The input consists of strings ½ Ò . The question is whether is in the c...
Elmar Böhler, Christian Glaßer, Bernhar...
MTDT
2003
IEEE
105views Hardware» more  MTDT 2003»
14 years 3 months ago
A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...
Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu L...
DATE
2010
IEEE
156views Hardware» more  DATE 2010»
14 years 3 months ago
Domain specific architecture for next generation wireless communication
—In order to solve the challenges in processor design for the next generation wireless communication systems, this paper first proposes a system level design flow for communicati...
Botao Zhang, Hengzhu Liu, Heng Zhao, Fangzheng Mo,...
KBSE
2002
IEEE
14 years 3 months ago
Generative Design Patterns
A design pattern encapsulates the knowledge of object-oriented designers into re-usable artifacts. A design pattern is a descriptive device that fosters software design re-use. Th...
Steve MacDonald, Duane Szafron, Jonathan Schaeffer...