27827 search results - page 19 / 5566 » Generating |
VLSID
2002
IEEE
14 years 9 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
CHI
2002
ACM
14 years 9 months ago
2002
ACM
Generative design theories are needed to b ridge the gaps between pure scientific knowledge, individual ("point") designs and systematic generation of viable design alte...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
CSCWD
2009
Springer
14 years 3 months ago
2009
Springer
Constrained random simulation methodology still plays an important role in hardware verification due to the limited scalability of formal verification, especially for the large an...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...