| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
Niloy Ganguly, Biplab K. Sikdar, Parimal Pal Chaud...
Generative design theories are needed to b ridge the gaps between pure scientific knowledge, individual ("point") designs and systematic generation of viable design alte...
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
Constrained random simulation methodology still plays an important role in hardware verification due to the limited scalability of formal verification, especially for the large an...
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...