We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
The development of new Field-Programmed, MaskProgrammed and Laser-Programmed Gate Array architectures is hampered by the lack of realistic test circuits that exercise both the arc...
Michael D. Hutton, Jerry P. Grossman, Jonathan Ros...
- The problem of stochastic sequential machines (SSM) synthesis is addressed and its relationship with the constrained sequence generation problem which arises during power estimat...
We describe the automatic generation of a provably correct compiler for a non-trivial subset of Ada. The compiler is generated from an emantic description; it emits absolute code ...
We discuss important factors in the design of evaluation studies for systems that generate animations of American Sign Language (ASL) sentences. In particular, we outline how some...
Matt Huenerfauth, Liming Zhao, Erdan Gu, Jan M. Al...