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ICCAD
1997
IEEE
147views Hardware» more  ICCAD 1997»
14 years 1 months ago
Built-in test generation for synchronous sequential circuits
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
Irith Pomeranz, Sudhakar M. Reddy
DAC
1996
ACM
14 years 1 months ago
Characterization and Parameterized Random Generation of Digital Circuits
The development of new Field-Programmed, MaskProgrammed and Laser-Programmed Gate Array architectures is hampered by the lack of realistic test circuits that exercise both the arc...
Michael D. Hutton, Jerry P. Grossman, Jonathan Ros...
DAC
1996
ACM
14 years 1 months ago
Stochastic Sequential Machine Synthesis Targeting Constrained Sequence Generation
- The problem of stochastic sequential machines (SSM) synthesis is addressed and its relationship with the constrained sequence generation problem which arises during power estimat...
Diana Marculescu, Radu Marculescu, Massoud Pedram
ICCL
1992
IEEE
14 years 29 days ago
An automatically generated and provably correct compiler for a subset of Ada
We describe the automatic generation of a provably correct compiler for a non-trivial subset of Ada. The compiler is generated from an emantic description; it emits absolute code ...
Jens Palsberg
ASSETS
2007
ACM
14 years 26 days ago
Evaluating American Sign Language generation through the participation of native ASL signers
We discuss important factors in the design of evaluation studies for systems that generate animations of American Sign Language (ASL) sentences. In particular, we outline how some...
Matt Huenerfauth, Liming Zhao, Erdan Gu, Jan M. Al...