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» Generating Tests from Counterexamples
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PPDP
2009
Springer
14 years 4 months ago
Dependent type inference with interpolants
We propose a novel type inference algorithm for a dependentlytyped functional language. The novel features of our algorithm are: (i) it can iteratively refine dependent types wit...
Hiroshi Unno, Naoki Kobayashi
MEMOCODE
2010
IEEE
13 years 7 months ago
LTSs for translation validation of (multi-clocked) SIGNAL specifications
Design of critical embedded systems demands for guarantees on the reliability of the implementation/compilation of a specification. In general, this guarantee takes either the form...
Julio C. Peralta, Thierry Gautier, Loïc Besna...
DATE
1999
IEEE
102views Hardware» more  DATE 1999»
14 years 2 months ago
Minimal Length Diagnostic Tests for Analog Circuits using Test History
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
Alfred V. Gomes, Abhijit Chatterjee
FASE
2009
Springer
14 years 4 months ago
Reducing the Costs of Bounded-Exhaustive Testing
Abstract. Bounded-exhaustive testing is an automated testing methodology that checks the code under test for all inputs within given bounds: first the user describes a set of test...
Vilas Jagannath, Yun Young Lee, Brett Daniel, Dark...
ERLANG
2003
ACM
14 years 3 months ago
Automated test generation for industrial Erlang applications
We present an implemented technique for generating test cases from state machine specifications. The work is motivated by a need for testing of protocols and services developed b...
Johan Blom, Bengt Jonsson