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ICCAD
1998
IEEE
116views Hardware» more  ICCAD 1998»
14 years 2 months ago
On primitive fault test generation in non-scan sequential circuits
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
Ramesh C. Tekumalla, Premachandran R. Menon
ICST
2009
IEEE
14 years 4 months ago
Test Input Generation Using UML Sequence and State Machines Models
We propose a novel testing approach that combines information from UML sequence models and state machine models. Current approaches that rely solely on sequence models do not cons...
Aritra Bandyopadhyay, Sudipto Ghosh
FATES
2003
Springer
14 years 3 months ago
Property Oriented Test Case Generation
Abstract. In this paper we propose an approach to automatically produce test cases allowing to check the satis ability of a linear property on a given implementation. Linear proper...
Jean-Claude Fernandez, Laurent Mounier, Cyril Pach...
ISSRE
2006
IEEE
14 years 4 months ago
A Systematic Approach to Generate Inputs to Test UML Design Models
Practical model validation techniques are needed for model driven development (MDD) techniques to succeed. This paper presents an approach to generating inputs to test UML design ...
Trung T. Dinh-Trong, Sudipto Ghosh, Robert B. Fran...
FATES
2003
Springer
14 years 3 months ago
Mutually Enhancing Test Generation and Specification Inference
Generating effective tests and inferring likely program specifications are both difficult and costly problems. We propose an approach in which we can mutually enhance the tests and...
Tao Xie, David Notkin