68 search results - page 10 / 14 » Generation of compact test sets with high defect coverage |
VLSID
2005
IEEE
14 years 7 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
VLSID
2000
IEEE
13 years 11 months ago
2000
IEEE
We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
We define a robust fault model as a model where the existence of an undetectable fault implies the existence of logic redundancy, or more generally, a suboptimality in the synthe...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Functional verification of systems is aimed at validating the integration of previously verified components. It deals with complex designs, and invariably suffers from scarce re...
TACAS
2009
Springer
14 years 2 months ago
2009
Springer
Software testing is an essential process to improve software quality in practice. Researchers have proposed several techniques to automate parts of this process. In particular, sym...