68 search results - page 9 / 14 » Generation of compact test sets with high defect coverage |
TVLSI
2008
13 years 7 months ago
2008
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
SIGSOFT
1998
ACM
13 years 11 months ago
1998
ACM
This paper reports on an empirical evaluation of the fault-detecting ability of two white-box software testing techniques: decision coverage (branch testing) and the all-uses data...
SRDS
2008
IEEE
14 years 1 months ago
2008
IEEE
Firewalls are the mainstay of enterprise security and the most widely adopted technology for protecting private networks. As the quality of protection provided by a firewall dire...
DAC
1997
ACM
13 years 11 months ago
1997
ACM
The biggest obstacle in the formal verification of large designs is their very large state spaces, which cannot be handled even by techniques such as implicit state space travers...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...