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GLVLSI
2005
IEEE
122views VLSI» more  GLVLSI 2005»
14 years 1 months ago
Thermal aware cell-based full-chip electromigration reliability analysis
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...
Syed M. Alam, Donald E. Troxel, Carl V. Thompson
IPPS
1997
IEEE
13 years 12 months ago
Nearly Optimal One-To-Many Parallel Routing in Star Networks
Star networks were proposedrecently as an attractive alternative to the well-known hypercube models for interconnection networks. Extensive research has been performed that shows ...
Chi-Chang Chen, Jianer Chen
GECCO
2008
Springer
161views Optimization» more  GECCO 2008»
13 years 8 months ago
An evolutionary design technique for collective communications on optimal diameter-degree networks
Scheduling collective communications (CC) in networks based on optimal graphs and digraphs has been done with the use of the evolutionary techniques. Inter-node communication patt...
Jirí Jaros, Vaclav Dvorak
DAC
2007
ACM
14 years 8 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DSN
2002
IEEE
14 years 19 days ago
Ditto Processor
Concentration of design effort for current single-chip Commercial-Off-The-Shelf (COTS) microprocessors has been directed towards performance. Reliability has not been the primary ...
Shih-Chang Lai, Shih-Lien Lu, Jih-Kwon Peir