1045 search results - page 52 / 209 » Genetic Simulation Library |
WSC
2007
14 years 11 days ago
2007
The transition to 300mm wafer size introduced a lot of new technologies to wafer fabrication facilities that mandated the presence of intrabay automated material handling systems ...
ESM
2000
13 years 11 months ago
2000
The framework of this paper is the design of complex communication protocols by simulation, based on formal description techniques (FDT). We propose a general-purpose scalable mod...
VTS
2005
IEEE
14 years 3 months ago
2005
IEEE
— A closed-form model for simulation and analysis of voltage transients caused by single-event upsets (SEUs) in logic circuits is described. A linear RC model, derived using a SP...
ICCS
2004
Springer
14 years 3 months ago
2004
Springer
Real world problems such as fire propagation prediction, can often be considered as a compositional combination of multiple, simple but coupled subproblems corresponding to analyt...
ITC
1994
IEEE
14 years 2 months ago
1994
IEEE
For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...