388 search results - page 13 / 78 » Guiding random test generation with program analysis |
KBSE
2006
IEEE
14 years 2 months ago
2006
IEEE
Software systems often undergo many revisions during their lifetime as new features are added, bugs repaired, abstractions simplified and refactored, and performance improved. Wh...
ICST
2008
IEEE
14 years 3 months ago
2008
IEEE
Intuition suggests that random testing of object-oriented programs should exhibit a high difference in the number of defects detected by two different runs over the same amount of...
LOPSTR
1994
Springer
14 years 27 days ago
1994
Springer
A technique for transformation of definite logic programs is presented. A first phase performs an analysis of the extended call/exit patterns of the source program. It is shown tha...
VLSID
2007
IEEE
14 years 9 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...