809 search results - page 40 / 162 » Handling variations and uncertainties |
FTEDA
2006
13 years 8 months ago
2006
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...
ECAL
2003
Springer
14 years 1 months ago
2003
Springer
Abstract. In this paper, a computational model of a successful negotiated communication system is presented, in which language agents develop their own meanings in response to thei...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper tackles the problem of dynamic power management (DPM) in nanoscale CMOS design technologies that are typically affected by increasing levels of process, voltage, and te...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
IMR
2003
Springer
14 years 1 months ago
2003
Springer
This paper presents recent progress and extensions to TriQuaMesh (TQM) [1], targeted at providing good quality surface meshes: Increased robustness of the 1D mesh generator to han...