85 search results - page 11 / 17 » Hardness of Optimal Spaced Seed Design |
EVOW
2008
Springer
13 years 11 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
DATE
2009
IEEE
14 years 1 months ago
2009
IEEE
In the digital VLSI cycle, logic transformations are often required to modify the design to meet different synthesis and optimization goals. Logic transformations on sequential ci...
EOR
2007
2007
Solving the short-term electrical generation scheduling problem by an adaptive evolutionary approach
13 years 9 months ago
In this paper, we introduce an adaptive evolutionary approach to solve the short-term electrical generation scheduling problem (STEGS). The STEGS is a hard constraint satisfaction...
CASES
2007
ACM
2007
ACM
INTACTE: an interconnect area, delay, and energy estimation tool for microarchitectural explorations
14 years 1 months ago
Prior work on modeling interconnects has focused on optimizing the wire and repeater design for trading off energy and delay, and is largely based on low level circuit parameters....
GECCO
2009
Springer
14 years 4 months ago
2009
Springer
Evolutionary Computation is an exciting research field with the power to assist researchers in the task of solving hard optimization problems (i.e., problems where the exploitabl...