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IPPS
2007
IEEE
14 years 3 months ago
Formal Analysis for Debugging and Performance Optimization of MPI
High-end computing is universally recognized to be a strategic tool for leadership in science and technology. A significant portion of high-end computing is conducted on clusters...
Ganesh Gopalakrishnan, Robert M. Kirby
DAC
2001
ACM
14 years 10 months ago
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
Li Chen, Xiaoliang Bai, Sujit Dey
VLSID
2007
IEEE
160views VLSI» more  VLSID 2007»
14 years 10 months ago
Spectral RTL Test Generation for Microprocessors
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
Nitin Yogi, Vishwani D. Agrawal
ICSE
2009
IEEE-ACM
14 years 4 months ago
JUnitMX - A change-aware unit testing tool
Developers use unit testing to improve the quality of software systems. Current development tools for unit testing help to automate test execution, to report results, and to gener...
Jan Wloka, Barbara G. Ryder, Frank Tip
ISSTA
2009
ACM
14 years 4 months ago
A formal analysis of requirements-based testing
The aim of requirements-based testing is to generate test cases from a set of requirements for a given system or piece of software. In this paper we propose a formal semantics for...
Charles Pecheur, Franco Raimondi, Guillaume Brat