- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...
Image registration between multi-sensor imagery is a challenging problem due to the difficulties associated with finding a correspondence between pixels from images taken by the...
We present a novel method for 3D shape recovery based on a combination of visual hull information and multi image stereo. We start from a coarse triangle mesh extracted from visua...
Hendrik Kiick, Wolfgang Heidrich, Christian Vogelg...
Local binary pattern (LBP), fast and simple for implementation, has shown its superiority in face and palmprint recognition. To extract representative features, "uniform"...
We present a method to represent unstructured scalar fields at multiple levels of detail. Using a parallelizable classification algorithm to build a cluster hierarchy, we generate...