4095 search results - page 165 / 819 » How to test a tree |
ETS
2006
IEEE
14 years 4 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
GECCO
2005
Springer
14 years 4 months ago
2005
Springer
The efficient and effective generation of test-data from high-level models is of crucial importance in advanced modern software engineering. Empirical studies have shown that muta...
KBSE
2003
IEEE
14 years 4 months ago
2003
IEEE
The use of techniques for automating the generation of software test cases is very important as it can reduce the time and cost of this process. The latest methods for automatic g...
ARITH
1999
IEEE
14 years 3 months ago
1999
IEEE
Comprehensive testing of any implementation of the RSA cryptosystem requires the use of a number of moduli with specific properties. It is shown how to generate a sufficient varie...
DATE
2004
IEEE
14 years 2 months ago
2004
IEEE
In this paper we describe how we applied a BIST-based approach to the test of a logic core to be included in System-on-achip (SoC) environments. The approach advantages are the ab...