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ETS
2006
IEEE
119views Hardware» more  ETS 2006»
14 years 4 months ago
On-Chip Test Generation Using Linear Subspaces
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
Ramashis Das, Igor L. Markov, John P. Hayes
GECCO
2005
Springer
113views Optimization» more  GECCO 2005»
14 years 4 months ago
Search-based mutation testing for Simulink models
The efficient and effective generation of test-data from high-level models is of crucial importance in advanced modern software engineering. Empirical studies have shown that muta...
Yuan Zhan, John A. Clark
KBSE
2003
IEEE
14 years 4 months ago
Automated Software Testing Using a Metaheuristic Technique Based on Tabu Search
The use of techniques for automating the generation of software test cases is very important as it can reduce the time and cost of this process. The latest methods for automatic g...
Eugenia Díaz, Javier Tuya, Raquel Blanco
ARITH
1999
IEEE
14 years 3 months ago
Moduli for Testing Implementations of the RSA Cryptosystem
Comprehensive testing of any implementation of the RSA cryptosystem requires the use of a number of moduli with specific properties. It is shown how to generate a sufficient varie...
Colin D. Walter
DATE
2004
IEEE
120views Hardware» more  DATE 2004»
14 years 2 months ago
Testing Logic Cores using a BIST P1500 Compliant Approach: A Case of Study
In this paper we describe how we applied a BIST-based approach to the test of a logic core to be included in System-on-achip (SoC) environments. The approach advantages are the ab...
Paolo Bernardi, Guido Masera, Federico Quaglio, Ma...