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DATE
2007
IEEE
81views Hardware» more  DATE 2007»
14 years 2 months ago
Using the inter- and intra-switch regularity in NoC switch testing
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...
Mohammad Hosseinabady, Atefe Dalirsani, Zainalabed...
APAQS
2001
IEEE
13 years 11 months ago
End-to-End Integration Testing
Integration testing has always been a challenge especially if the system under test is large with many subsystems and interfaces. This paper proposes an approach to design End-toE...
Raymond A. Paul
SDM
2009
SIAM
204views Data Mining» more  SDM 2009»
14 years 5 months ago
Application of Bayesian Partition Models in Warranty Data Analysis.
Automotive companies are forced to continuously extend and improve their product line-up. However, increasing diversity, higher design complexity, and shorter development cycles c...
Axel Blumenstock, Christoph Schlieder, Markus M&uu...
APPROX
2008
Springer
245views Algorithms» more  APPROX 2008»
13 years 9 months ago
Approximating Optimal Binary Decision Trees
Abstract. We give a (ln n + 1)-approximation for the decision tree (DT) problem. An instance of DT is a set of m binary tests T = (T1, . . . , Tm) and a set of n items X = (X1, . ....
Micah Adler, Brent Heeringa
WADS
2007
Springer
165views Algorithms» more  WADS 2007»
14 years 1 months ago
A Near Linear Time Approximation Scheme for Steiner Tree Among Obstacles in the Plane
We present a polynomial-time approximation scheme (PTAS) for the Steiner tree problem with polygonal obstacles in the plane with running time O(n log2 n), where n denotes the numb...
Matthias Müller-Hannemann, Siamak Tazari