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DATE
2007
IEEE
81views Hardware» more  DATE 2007»
15 years 9 months ago
Using the inter- and intra-switch regularity in NoC switch testing
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...
Mohammad Hosseinabady, Atefe Dalirsani, Zainalabed...
APAQS
2001
IEEE
15 years 7 months ago
End-to-End Integration Testing
Integration testing has always been a challenge especially if the system under test is large with many subsystems and interfaces. This paper proposes an approach to design End-toE...
Raymond A. Paul
137
Voted
SDM
2009
SIAM
204views Data Mining» more  SDM 2009»
16 years 16 days ago
Application of Bayesian Partition Models in Warranty Data Analysis.
Automotive companies are forced to continuously extend and improve their product line-up. However, increasing diversity, higher design complexity, and shorter development cycles c...
Axel Blumenstock, Christoph Schlieder, Markus M&uu...
APPROX
2008
Springer
245views Algorithms» more  APPROX 2008»
15 years 5 months ago
Approximating Optimal Binary Decision Trees
Abstract. We give a (ln n + 1)-approximation for the decision tree (DT) problem. An instance of DT is a set of m binary tests T = (T1, . . . , Tm) and a set of n items X = (X1, . ....
Micah Adler, Brent Heeringa
WADS
2007
Springer
165views Algorithms» more  WADS 2007»
15 years 9 months ago
A Near Linear Time Approximation Scheme for Steiner Tree Among Obstacles in the Plane
We present a polynomial-time approximation scheme (PTAS) for the Steiner tree problem with polygonal obstacles in the plane with running time O(n log2 n), where n denotes the numb...
Matthias Müller-Hannemann, Siamak Tazari